This Catalog is a compilation of equipment at the six Israel nano centers available to all users on a fee basis: internal users, researchers at other universities and industry

Instrument	Description	Equipment Location	Operator'>Technion Faculty		Academia	Industry	Operator	Faculty in Charge/Link	Contact email	Contact phone
			Operator	Self
OPTICAL TWEEZERS	The PALM Microtweezers is a fully automated optical manipulation system used to trap dielectric microspheres, viruses, bacteria, living mammalian cells, organelles, liposomes, small metal particles, and even strands of DNA. Applications include confinement and organization (e.g. for cell sorting), tracking of movement (e.g. of motile cells), application and measurement of small forces, and altering of larger biological structures (such as cell membranes). Some of the main uses for optical traps have been the study of molecular motors, the biomechanical properties of cells, lyposomes, and biological molecules, and the physical properties of DNA. Used in conjunction with more conventional microfluidic drives, optical tweezers could be used to assemble biological molecules in microchannels, to optically reroute samples, and to elucidate new forces (both hydrodynamic and hemodynamic) that will be of practical importance to both micromechanical and microfluidic systems.	Center for Biomechanical Micro and Nano Manipulation (currently located in the Physics faculty)	-	25$	25$	40$	Dr. Kinneret Keren	http://www.bm.technion.ac.il/	[e-mail]	04-8292741
LASER MICRO-DISSECTOR	The PALM MicroBeam C laser micro-dissector is a fully digitized and computer controlled microscopy system offering new possibilities in live-cell applications, such as the isolation of single and groups of cells under the microscope for the purpose of further growth or molecular biological analysis. The PALM system is capable of micromanipulation of up to 24 different types of live cells. The PALM is also capable of automated sample acquisition using advanced image processing software, making it possible to identify and isolate cell populations based on morphological features	Center for Biomechanical Micro and Nano Manipulation	-	25$	25$	40$	Dr. Oleg Verbitsky	http://www.bm.technion.ac.il/	[e-mail]	04-8294805
SIMS – Secondary Ion Mass Spectrometry (Cameca ims4f)	Trace and major elements analysis, including hydrogen, in solids and thin films. Depth profiling from small areas with detection sensitivity in the ppm-ppb region.	Solid State Institute	60$	-	120$	200$	Catherine Cytermann; Dr. Reuven Brener	http://surfaces.technion.ac.il/	[e-mail] ; [e-mail]	04-8293547/5638
XPS – X-ray Photoelectron Spectroscopy (Thermo VG Scientific Sigma Probe)	Small area chemical analysis of solid surfaces with chemical bonding information obtained by using a microfocused (from 15 to 400 μm) monochromated x-ray source. Angle resolved information is obtained with and without tilting the sample. Depth profiling with excellent depth resolution.	Solid State Institute	60$	-	120$	200$	Dr. Reuven Brener	http://surfaces.technion.ac.il/	[e-mail]	04-8293547/5638

Instrument	Description	Equipment Location	Technion Faculty		Academia	Industry	Operator	Faculty in Charge/Link	Contact email	Contact phone
			Operator	Self
SAM – Scanning Auger Microscopy (Thermo VG Scientific Microlab 350)	Elemental analysis of solid surfaces with high spatial resolution (7 nm in SEM and 12 nm in Auger modes). Depth profiling with excellent depth resolution.	Solid State Institute	60$	-	120$	200$	Dr. Reuven Brener	http://surfaces.technion.ac.il/	[e-mail]	04-8293547/5638
STM/AFM - Scanning Tunneling/Atomic Force Microscopy (Omicron UHV SPM)	Structural surface analysis with atomic resolution. Local topography, electronic and chemical properties of solid surfaces with nanometer spatial resolution. The surface probe microscopy measurements are performed in ultra high vacuum and at variable temperatures between 25 to1500K.	Solid State Institute	50$	20$	50$	180$	Dr. Cecile Saguy; Dr. Reuven Brener	http://surfaces.technion.ac.il/	[e-mail]; [e-mail]	04-8293547/5638
NSOM/AFM - Near-field Scanning Optical/Atomic Force Microscopy (Nanonics CryoView 2000)	Simultaneous characterization of solid samples by AFM and NSOM at temperatures between 10 to down to 300K. Photoluminescence, reflection and transmission optical characterization of surfaces with spatial resolution below the diffraction limit.	Solid State Institute	30$	-	30$	180$	Evgeny Linder		[e-mail]	04-8293919
HR XRD – High Resolution X-ray Diffraction (Philips Four Crystal Diffractometer)	Characterization of thin epitaxial layers. Composition, layer thickness, state of relaxation as well as periods and mean mismatch  of superlattices in multilayered structures can be determined.	Solid State Institute	38$	16$	60$	80$	Avraham Raanan		[e-mail]	04-8293639
Micro Raman Spectroscopy (Dilor Double Spectrometer)	Characterization of crystal quality and microstructure of solid materials and epitaxial layers with spatial resolution as low as 1μm. Characterization of order and stress in semiconductors.	Solid State Institute	38$	16$	60$	80$	Dr. Albert Chack		[e-mail]	04-8293933 04-8293655

Instrument	Description	Equipment Location	Technion Faculty		Academia	Industry	Operator	Faculty in Charge/Link	Contact email	Contact phone
			Operator	Self
Ion Implantation (HVEE 320 KeV Ion Implanter)	Ion implantation into semiconductors and other materials at various temperatures, doses and energies.	Solid State Institute	The cost depends on the specifics of the requested implantation (ion species, ion dose, sample size, number of samples to be implanted under similar conditions, particular implantation conditions, etc.). For a specific quotation pls. cantact the ion implantation laboratory.				Dr. Richter Vladimir		[e-mail]	04-8293907/3908
ToF-SIMS – Time of Flight Secondary Ion Mass Spectrometry (Ion ToF ToF-SIMS 5)	Elemental and molecular information from the uppermost layer of organic and inorganic surfaces. Shallow depth profiling and imaging of thin layers with nanometer scale depth resolution, submicron lateral resolution and ppm sensitivity.	Solid State Institute	60$	-	120$	200$	Catherine Cytermann; Dr. Reuven Brener	http://surfaces.technion.ac.il/	[e-mail]; [e-mail]	04-8293148 04-8295638
Transmission Electron Microscope - FEI Titan 80-300 KeV FEG-S/TEM	The Titan 80-300 FEG-S/TEM (FEI) is an all-new platform dedicated to correction and monochromator technology. The Titan S/TEM system is the world's highest resolution commercially-available microscope, yielding powerful sub-Angstrom (atomic scale) imaging and analysis. The microscope includes: A monochromator for sub-eV energy resolution (80-300kV) An aberration corrector for the objective system (80-300kV) A high resolution energy filter, for sub-eV EELS and energy filtered TEM A high resolution STEM system, including HAADF, BF and DF EDS for local chemical analysis A double-tilt hot stage (1000°C) for in-situ studies A double-tilt cryo-stage (liquid N2) for life-science and CBED/EELS analysis TV-Rate CCD (for real time movie recording) and high resolution slow scan CCD (for imaging) TEM and STEM tomography.	Electron Microscopy Center (Materials Engineering faculty)					Dr. Yaron Kauffmann 04-8294567		http://materials2.technion.ac.il/Mika/index.php	04-8294567
Scanning Electron Microscope - FEI E-SEM Quanta 200	An environmental SEM, enabling characterization of non-conducting without a conductive, and is equipped with EDS (light element), WDS and EBSD.	Electron Microscopy Center (Materials Engineering faculty)					Dr. Alex Berner 04-8294568		http://materials2.technion.ac.il/Mika/index.php	04-8294568

Instrument	Description	Equipment Location	Technion Faculty		Academia	Industry	Operator	Faculty in Charge/Link	Contact email	Contact phone
			Operator	Self
Plasma Cleaner	Fischione plasma cleaner – model 1020	Electron Microscopy Center (Materials Engineering faculty)					Dr. Yaron Kauffmann 04-8294567		http://materials2.technion.ac.il/Mika/index.php
Transmission Electron Microscope - FEI Tecnai G2 T20 S-Twin TEM	A 200KeV (or 120KeV) TEM with a LaB6 electron source and an FEI Supertwin Objective Lens. This microscope is also equipped with a BF and DF STEM detectors, an EDX detector, a plate camera and a 1Kx1K Gatan 694 retractable slow scan CCD	Electron Microscopy Center (Materials Engineering faculty)					Dr. Yaron Kauffmann 04-8294567		http://materials2.technion.ac.il/Mika/index.php	04-8294567
Electron Microscopy Specimen Preparation Lab	The lab includes: variable speed grinder/polishers (Buehler EcoMet 3000), precision sectioning saw (Buehler IsoMet Low Speed Saw), semiautomatic grinder/polisher (Buehler MiniMet 1000), Gatan 656 Dimple Grinder, Polaron gold and carbon coaters, Fischione plasma cleaner – model 1020, Gatan 691 Precision Ion Polishing System (PIPS), IV8 Gentle Mill – low energy ion miller and a Microtom system for soft materials sectioning	Electron Microscopy Center (Materials Engineering faculty)					Michael Kalina 04-8294518		http://materials2.technion.ac.il/Mika/index.php	04-8294518
Light Microscopes	Light microscopy is based on two metallurgical light microscopes: The Zeiss Axiophot which includes a CCD and video printer system. A Reichert Polyvar Z microscope linked to a computer via a CCD for image analysis using the SIS Software Imaging System.	Electron Microscopy Center (Materials Engineering faculty)					Michael Kalina 04-8294518		http://materials2.technion.ac.il/Mika/index.php	04-8294518
LEO Gemini 982	A field emission gun SEM (FEG-SEM) which includes an in-lens detector for low voltage applications, an EDAX light-element EDS system, and an Oxford electron backscattered electron diffraction system (EBSD).	Materials Engineering faculty. This microscope is located in the Wolfson Centre for Interface Science, located adjacent to the Electron Microscopy Center.					Dr. Alex Berner 04-8294568		http://materials2.technion.ac.il/Mika/index.php	04-8294568