This Catalog is a compilation of equipment at the six Israel nano centers available to all users on a fee basis: internal users, researchers at other universities and industry



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Instrument

Description

Equipment Location

Operator'>Weizmann Faculty

Academia

Industry

Operator

Faculty in Charge

Contact email

Contact phone

Operator

Self







 

workstation for 32P and 35S radioactive work

Chemical & Biophysical NanoSciences

 

 

 

 

 

Dr. Shirley Daube

shirley.daube@weizmann.ac.il

08-934-4974

 

Scanning electron microscopes (SEM)

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

ESEM

FEI. equipped with EDS systems for elemental analysis

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

ULTRA-55 ZEISS

 

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

SUPRA-55 VP ZEISS

Includes nanomanipulator and Electron Beam Induced Current (EBIC) imaging system. Equipped with EDS systems for elemental analysis

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

Tecnai F-30 FEI

High resolution TEM microscope (resolution of 1.7A) equipped with a double tilt holder. Attached to this 300kV microscope is a post column Gatan Imaging mFilter (GIF) which enables EELS measurements (electron energy loss spectra) and elemental mapping at nanometer scale.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

CM-120 PHILIPS

TEM for materials science equipped with EDS for elemental analysis.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

NOVA 600

FEI dual beam microscope, including a focused ion beam (FIB) column and a SEM column. This microscope has excellent HR imaging, nano-scale patterning (material deposit or etch) and sample cross-sectioning for TEM analysis, using an advanced Omniprobe micromanipulator.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

TECNAI T-12 FEI

TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

TECNAI F-20 FEI

TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work. Includes computer-controlled sample stage and high-resolution 4k x 4k CCD camera (TVIPS), for automated tomographic applications.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

CM-12 PHILIPS

TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

Sample Preparation

polishing apparatus, dimpling, ion milling machines, sputter, and physical evaporation apparatus, a critical point dryer, and several ultramicrotomes.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541



Instrument

Description

Equipment Location

Weizmann Faculty

Academia

Industry

Operator

Faculty in Charge

Contact email

Contact phone

Operator

Self







Equipment for cryo-applications

High-pressure freezing, cryo-plunging, freeze substitution and cryo-sectioning.

Electron Microscopy Unit

 

 

 

 

 

Orna Yeger

orna.yeger@weizmann.ac.il

08-934-4541

 

The Ultrahigh Vacuum Unit is a multifaceted system for surface analyses at pressures below 10-9 torr. The main analysis chamber includes a Kratos Axis HS photoelectron spectrometer, which detects elements and determines their chemical state on the surface at depths up to 3 nm with sensitivity of 0.1%. The system includes an ultraviolet lamp for valence band measurements, monochromator for high resolution work, ion gun for sputtering the surface, and flood gun for insulating samples. In addition, an electron gun for performing electron energy loss spectroscopy has been installed. A second vacuum chamber attached to the analysis chamber contains a VG Low Energy Electron Diffractometer to determine the surface crystalline state.

Surface Analysis Unit

 

 

 

 

 

Dr. Sidney Cohen - Scanned Probe Microscopy; Dr. Hagai Cohen - Ultrahigh Vacuum

sidney.cohen@weizmann.ac.il ; hagai.cohen@weizmann.ac.il

08-934-2703; 08-934-3422

Digital Instruments Nanoscope

Scanning tunneling/scanning force microscopes

Surface Analysis Unit

 

 

 

 

 

sidney.cohen@weizmann.ac.il ; hagai.cohen@weizmann.ac.il

08-934-2703; 08-934-3423

NT-MDT P47/LS

Scanning tunneling/scanning force microscope

Surface Analysis Unit

 

 

 

 

 

sidney.cohen@weizmann.ac.il ; hagai.cohen@weizmann.ac.il

08-934-2703; 08-934-3424

NTEGRA

Scanning tunneling/scanning force microscope

Surface Analysis Unit

 

 

 

 

 

sidney.cohen@weizmann.ac.il ; hagai.cohen@weizmann.ac.il

08-934-2703; 08-934-3425

RIBER MBE

Three customized MBE systems. Growth of pure III-V semiconductor materials.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3896

JEOL

High resolution EBEAM system (resolution 3.5nm, direct writing ~10 nm, mask features <0.5 micrometers). Processing and fabrication of submicron and nano-scale devices.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3897

 

A sophisticated optical lithography laboratory; containing two mask aligners.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3898



Instrument

Description

Equipment Location

Weizmann Faculty

Academia

Industry

Operator

Faculty in Charge

Contact email

Contact phone

Operator

Self







Leo

Scanning electron microscope (resolution 1.2 nm).

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3899

 

Metal deposition (two evaporators) and plasma dry etching facilities.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3900

 

Plasma deposition of insulators and plasma etching system.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3901

 

Packaging and characterization of submicron electronic devices.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3902

 

A scanning tunneling microscope laboratory.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3903

 

Measuring and characterizing electrical properties down to 10 mK at fields up to 18 T.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3904

 

Measuring and characterizing optical properties down to 25 mK at fields up to 12 T.

Braun Center for Submicron Research

 

 

 

 

 

Prof. Moty Heiblum

Moty.Heiblum@weizmann.ac.il

08-934-3905

USER FEES AT WEIZMANN INSTITUTE NOT YET AVAILABLE

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