Instrument
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Description
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Equipment Location
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Operator'>Weizmann Faculty
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Academia
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Industry
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Operator
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Faculty in Charge
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Contact email
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Contact phone
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Operator
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Self
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workstation for 32P and 35S radioactive work
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Chemical & Biophysical NanoSciences
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Dr. Shirley Daube
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shirley.daube@weizmann.ac.il
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08-934-4974
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Scanning electron microscopes (SEM)
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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ESEM
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FEI. equipped with EDS systems for elemental analysis
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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ULTRA-55 ZEISS
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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SUPRA-55 VP ZEISS
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Includes nanomanipulator and Electron Beam Induced Current (EBIC) imaging system. Equipped with EDS systems for elemental analysis
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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Tecnai F-30 FEI
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High resolution TEM microscope (resolution of 1.7A) equipped with a double tilt holder. Attached to this 300kV microscope is a post column Gatan Imaging mFilter (GIF) which enables EELS measurements (electron energy loss spectra) and elemental mapping at nanometer scale.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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CM-120 PHILIPS
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TEM for materials science equipped with EDS for elemental analysis.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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NOVA 600
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FEI dual beam microscope, including a focused ion beam (FIB) column and a SEM column. This microscope has excellent HR imaging, nano-scale patterning (material deposit or etch) and sample cross-sectioning for TEM analysis, using an advanced Omniprobe micromanipulator.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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TECNAI T-12 FEI
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TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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TECNAI F-20 FEI
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TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work. Includes computer-controlled sample stage and high-resolution 4k x 4k CCD camera (TVIPS), for automated tomographic applications.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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CM-12 PHILIPS
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TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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Sample Preparation
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polishing apparatus, dimpling, ion milling machines, sputter, and physical evaporation apparatus, a critical point dryer, and several ultramicrotomes.
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Electron Microscopy Unit
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Orna Yeger
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orna.yeger@weizmann.ac.il
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08-934-4541
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