This Catalog is a compilation of equipment at the six Israel nano centers available to all users on a fee basis: internal users, researchers at other universities and industry

Instrument	Description	Equipment Location	Operator'>Weizmann Faculty		Academia	Industry	Operator	Faculty in Charge	Contact email	Contact phone
			Operator	Self
	workstation for 32P and 35S radioactive work	Chemical & Biophysical NanoSciences						Dr. Shirley Daube	[e-mail]	08-934-4974
	Scanning electron microscopes (SEM)	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
ESEM	FEI. equipped with EDS systems for elemental analysis	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
ULTRA-55 ZEISS		Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
SUPRA-55 VP ZEISS	Includes nanomanipulator and Electron Beam Induced Current (EBIC) imaging system. Equipped with EDS systems for elemental analysis	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
Tecnai F-30 FEI	High resolution TEM microscope (resolution of 1.7A) equipped with a double tilt holder. Attached to this 300kV microscope is a post column Gatan Imaging mFilter (GIF) which enables EELS measurements (electron energy loss spectra) and elemental mapping at nanometer scale.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
CM-120 PHILIPS	TEM for materials science equipped with EDS for elemental analysis.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
NOVA 600	FEI dual beam microscope, including a focused ion beam (FIB) column and a SEM column. This microscope has excellent HR imaging, nano-scale patterning (material deposit or etch) and sample cross-sectioning for TEM analysis, using an advanced Omniprobe micromanipulator.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
TECNAI T-12 FEI	TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
TECNAI F-20 FEI	TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work. Includes computer-controlled sample stage and high-resolution 4k x 4k CCD camera (TVIPS), for automated tomographic applications.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
CM-12 PHILIPS	TEM suitable for low-temperature applications and equipped with digital slow-scan cameras (CCDs) for low-dose work.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
Sample Preparation	polishing apparatus, dimpling, ion milling machines, sputter, and physical evaporation apparatus, a critical point dryer, and several ultramicrotomes.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541

Instrument	Description	Equipment Location	Weizmann Faculty		Academia	Industry	Operator	Faculty in Charge	Contact email	Contact phone
			Operator	Self
Equipment for cryo-applications	High-pressure freezing, cryo-plunging, freeze substitution and cryo-sectioning.	Electron Microscopy Unit						Orna Yeger	[e-mail]	08-934-4541
	The Ultrahigh Vacuum Unit is a multifaceted system for surface analyses at pressures below 10-9 torr. The main analysis chamber includes a Kratos Axis HS photoelectron spectrometer, which detects elements and determines their chemical state on the surface at depths up to 3 nm with sensitivity of 0.1%. The system includes an ultraviolet lamp for valence band measurements, monochromator for high resolution work, ion gun for sputtering the surface, and flood gun for insulating samples. In addition, an electron gun for performing electron energy loss spectroscopy has been installed. A second vacuum chamber attached to the analysis chamber contains a VG Low Energy Electron Diffractometer to determine the surface crystalline state.	Surface Analysis Unit						Dr. Sidney Cohen - Scanned Probe Microscopy; Dr. Hagai Cohen - Ultrahigh Vacuum	[e-mail] ; [e-mail]	08-934-2703; 08-934-3422
Digital Instruments Nanoscope	Scanning tunneling/scanning force microscopes	Surface Analysis Unit							[e-mail] ; [e-mail]	08-934-2703; 08-934-3423
NT-MDT P47/LS	Scanning tunneling/scanning force microscope	Surface Analysis Unit							[e-mail] ; [e-mail]	08-934-2703; 08-934-3424
NTEGRA	Scanning tunneling/scanning force microscope	Surface Analysis Unit							[e-mail] ; [e-mail]	08-934-2703; 08-934-3425
RIBER MBE	Three customized MBE systems. Growth of pure III-V semiconductor materials.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3896
JEOL	High resolution EBEAM system (resolution 3.5nm, direct writing ~10 nm, mask features <0.5 micrometers). Processing and fabrication of submicron and nano-scale devices.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3897
	A sophisticated optical lithography laboratory; containing two mask aligners.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3898

Instrument	Description	Equipment Location	Weizmann Faculty		Academia	Industry	Operator	Faculty in Charge	Contact email	Contact phone
			Operator	Self
Leo	Scanning electron microscope (resolution 1.2 nm).	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3899
	Metal deposition (two evaporators) and plasma dry etching facilities.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3900
	Plasma deposition of insulators and plasma etching system.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3901
	Packaging and characterization of submicron electronic devices.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3902
	A scanning tunneling microscope laboratory.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3903
	Measuring and characterizing electrical properties down to 10 mK at fields up to 18 T.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3904
	Measuring and characterizing optical properties down to 25 mK at fields up to 12 T.	Braun Center for Submicron Research						Prof. Moty Heiblum	[e-mail]	08-934-3905
USER FEES AT WEIZMANN INSTITUTE NOT YET AVAILABLE