268
PREPARATION AND PHYSICAL CHEMICAL PROPERTIES OF HIGH
COUNDUCTIVE NANOMATERIALS
Kamoladdin Saidov
1
*, Olim Ruzimuradov
2, 3
1
Institute of Material Science, Academy of Sciences of the
Republic of Uzbekistan,
Chingiz Aytmatov 2b, Tashkent, Uzbekistan.
2
Department of Chemistry, National University of Uzbekistan, Vuzgorodo15,
Tashkent, Uzbekistan.
3
Department of Natural
and Mathematic Sciences, Turin Polytechnic University in
Tashkent
Grafene nanomaterials have recently drawn much attention due to their unique
electrical, mechanical, and optical properties. The transition metal dichalcogenide
(TMD) are two dimentional (2D) semiconductor materials structure and molybdenum
ditelluride (MoTe
2
) materials shows excellent properties
such as high intrinsic
electrical conductivity, ultrahigh theoretical surface area of 2630 m
2
g
-1
, high
theoretical capacitance of 550 F g
-1
and high mechanical flexibility. Therefore,
graphene and TMDs based nanomaterials might be employed as excellent electrodes
for electrochemical, optoelectrochemical and electronic devices.
For this purpose,
electrolyte/ionic liquid based TMDs field effect transitors (FET) can effectively
increase the operation voltage. [1] In this work, we report the fabrication of ionic-
liquid (IL) gated FET
consisting of few-layer MoTe
2
. For the fabrication of the
vertical structures of the device, the MoTe
2
was grown via chemical vapor deposition
(CVD), transferred onto a Si/SiO
2
(300 nm SiO
2
) substrate, and patterned into 10 ×
50 μm strips as a floating gate using a photolithography and oxygen-plasma etching
process. This method includes of the required flakes onto a dual-layer polymer stack
Poly vinyl alcohol (PVA) and Poly methyl methacrylate (PMMA). The bottom
polymer (PVA) layer is dissolved in water and the resulting
membrane is inverted
and positioned above the target flake. The metal electrodes forprobe contact were
patterned on the MoTe
2
by e-beam deposition of Cr/Au (30/50nm) followed by e-
beam lithography. For stretching test devices, a thin polyimide (PI) film was formed
on
the SiO
2
/Si wafer by spin-coating polyamic acid (PAA) followed by annealing [2].
The
pristine
ionic-liquid
BMIMBF4
(1-Butyl-3-methylimidazolium
tetrafluoroborate) dropped onto MoTe
2
FET devices with channel and metal contacts.
Top gate Ti/Au the same deposited as we mentioned above and demonstrated a
rectification behavior of typical p junction diodes, because of the p-type and n-type
natures
of MoTe
2
. Our results indicate the possibility to utilize chemically and
electrostatically
highly
coated
for
versatile,
flexible,
and
transparent
semiconductors [3].