Handbook of Photovoltaic Science and Engineering


 COMPUTATION OF SERIES-CONNECTED DEVICE



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Photovoltaic science and engineering (1)

9.5 COMPUTATION OF SERIES-CONNECTED DEVICE
PERFORMANCE
9.5.1 Overview
This section discusses the quantitative modeling of the performance of series-connected,
two-terminal, two-junction devices. This analysis will provide the basis for a qualitative
understanding of the general trends in series-connected multijunction devices, as well
as the quantitative design of these devices. Emphasis is placed on selecting band gap
pairs and predicting the efficiency of the resulting structures. This modeling also lays the
groundwork for the analysis of the dependence of the device performance on the spec-
trum, the concentration, and the temperature. Although the emphasis is on two-junction
devices, we will occasionally extend the discussion to the analysis of a three-junction
device, GaInP/GaAs/Ge, which is of special interest due to its technical and commercial
success in space applications. Following the treatments of References [7, 18], we make


COMPUTATION OF SERIES-CONNECTED DEVICE PERFORMANCE
367
simplifying assumptions, which include (1) transparent zero-resistance tunnel-junction
interconnects, (2) no reflection losses, (3) no series-resistance losses, and (4) junctions
that collect every absorbed photon, and whose current–voltage (
J

V
) curves are described
by the ideal
(n
=
1
)
diode equation. Later, we relax assumption (2) to analyze the effect
of antireflection coatings; the relaxation of the other assumptions is straightforward, as
well. It should be noted that high-quality III-V cells have achieved 90% of these predicted
efficiencies.
9.5.2 Top and Bottom Subcell
QE
and
J
SC
The short-circuit current density
(J
SC
)
of each subcell is determined by the quantum
efficiency of the subcell,
QE
(λ)
, and by the spectrum of light incident on that cell

inc
(λ)
in the usual way:
J
SC
=
e

0
QE
(λ)
inc
(λ)
d
λ
(
9
.
1
)
The
QE
for an ideal cell of finite base thickness
x
b
, emitter thickness
x
e
, and depletion
width
W
(for a total thickness
x
=
x
e
+
W
+
x
b
,) is given by the standard equations [19]
QE
=
QE
emitter
+
QE
depl
+
exp[

α(x
e
+
W )
]
QE
base
(
9
.
2
)
where
QE
emitter
=
f
α
(L
e
)





e
+
αL
e

exp
(

αx
e
)
×
[

e
cosh
(x
e
/L
e
)
+
sinh
(x
e
/L
e
)
]

e
sinh
(x
e
/L
e
)
+
cosh
(x
e
/L
e
)

αL
e
exp
(

αx
e
)




(9.3)

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