Open Access proceedings Journal of Physics: Conference series

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IOP Conference Series: Materials Science and Engineering
PAPER • 
OPEN ACCESS
Automated testing and fault diagnosis of the
microcontroller system
To cite this article: D A Pankov and L A Denisova 2019 IOP Conf. Ser.: Mater. Sci. Eng. 537 022072
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IOP Conf. Series: Materials Science and Engineering 537 (2019) 022072
IOP Publishing
doi:10.1088/1757-899X/537/2/022072
1
Automated testing and fault diagnosis of the microcontroller 
system
D A Pankov and L A Denisova
 
Omsk State Technical University, 11, Pr. Mira, Omsk, 644050, Russia 
E-mail: [e-mail], [e-mail]
Abstract. 
The article deals with the problem systems automated testing of microcontrollers. A 
system architecture proposed for fault diagnosis and determining the consequences of device 
failures. Highlighted separately intermittent failure. The issue of integrating software and 
hardware failure simulation tools into the testing architecture investigated.
Model studies of the 
testing system performed and conducted diagnostics of simulated faults. The efficiency
technology of automated testing confirmed with simulation known failures types (injection) for 
the components of the performed microcontroller device is proposed.