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purpose is to understand at an atomic level what goes on during film growth and ion
irradiation. This is not without difficulties however. The MD simulations presented in this
thesis never involve more than 12000 atoms and simulation times never exceed 12 ns (due
to limited CPU power). This is far insufficient to produce a TDS spectrum, but the
simulations do provide very detailed information about every atom in the simulation at
practically any time during the simulation. Therefore the simulations are a useful tool to
investigate the sometimes very complicated atomic mechanisms and short time events, such
as argon trapping, helium implantation, sputtering etc. Some events that in real life would
require more time can be simulated by applying some ‘tricks’, such as increasing the
deposition rate to complete the deposition of a film within feasible simulation times, or
increasing the film temperature to speed up diffusion. Although this increases the number of
phenomena that can be studied, there are still some strong limitations. The tricks
compromise the physical reliability if they are carried too far. Also, since atoms are treated
as single, elementary particles, it is impossible to study properties that are governed by the
behaviour of electrons, such as optical, magnetic, electrical and thermal transport properties.
There is some justification for using Newtonian mechanics in the agreement between
classical MD results and ab-initio calculations, although there is also some disagreement
[1]. Because of their simplicity and computational efficiency, MD calculations have become
widely accepted as a research tool. For example, Wang
et al [2] have calculated fracture in
amorphous silica using two- and three body potentials and Carlberg
et al [3] have calculated
simulations to study defect generation in epitaxial Mo/W superlattices using the Johnson-Oh
Embedded Atom Method and Lennard-Jones pair potential. Still, despite their wide range of
applications, MD simulations are limited to those ‘mechanical’ experiments in which the
knowledge of individual electron states is unimportant, such as the study of atomic
movement and ion-solid interactions. The interactions between molybdenum atoms used in
this thesis do contain some information about the electronic structure of molybdenum in a
simplified way. The interactions between atoms, the implementation of a MD simulation on
a computer, and the possibilities and limitations are further discussed in chapter 2.
The main subjects of the simulations in this thesis are the influence of certain
deposition parameters on film growth (deposition angle and energy, film temperature, argon
energy, and ion to atom ratio), the effects of annealing, and the events taking place after
argon and helium ion impacts. Because of limited CPU power it is not possible to simulate
all possible combinations of parameters. Most combinations have been chosen in such a
way to form pairs between which only one parameter is varied. This means that some
conclusions may only be valid under certain circumstances. For instance, the influence of
film temperature during deposition has only been investigated for (110) PVD
*
films. A
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